MEASURED STARK WIDTH AND SHIFT OF 220.798 nm NEUTRAL SILICON SPECTRAL LINE

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MEASURED STARK WIDTH AND SHIFT OF 220.798 nm NEUTRAL SILICON SPECTRAL LINE

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dc.contributor.author Srećković, A.
dc.contributor.author Bukvić, S.
dc.contributor.author Djeniže, S.
dc.date.accessioned 2010-12-29T09:08:41Z
dc.date.available 2010-12-29T09:08:41Z
dc.date.issued 1997
dc.identifier.uri http://hdl.handle.net/123456789/1400
dc.description.provenance Submitted by Slavisha Milisavljevic (slavisha) on 2010-12-29T09:08:41Z No. of bitstreams: 1 30.pdf: 93832 bytes, checksum: c9a40befcad862e993fc226aed8ae349 (MD5) en
dc.description.provenance Made available in DSpace on 2010-12-29T09:08:41Z (GMT). No. of bitstreams: 1 30.pdf: 93832 bytes, checksum: c9a40befcad862e993fc226aed8ae349 (MD5) Previous issue date: 1997 en
dc.language.iso en en_US
dc.publisher Obs. Astron. Belgrade en_US
dc.title MEASURED STARK WIDTH AND SHIFT OF 220.798 nm NEUTRAL SILICON SPECTRAL LINE en_US
mf.document.pages 3 en_US
mf.contributor.editor-in-chief Dimitrijević, S. Milan

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