MEASURED STARK WIDTH AND SHIFT OF 220.798 nm NEUTRAL SILICON SPECTRAL LINE

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MEASURED STARK WIDTH AND SHIFT OF 220.798 nm NEUTRAL SILICON SPECTRAL LINE

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dc.contributor.author	Srećković, A.
dc.contributor.author	Bukvić, S.
dc.contributor.author	Djeniže, S.
dc.date.accessioned	2010-12-29T09:08:41Z
dc.date.available	2010-12-29T09:08:41Z
dc.date.issued	1997
dc.identifier.uri	http://hdl.handle.net/123456789/1400
dc.description.provenance	Submitted by Slavisha Milisavljevic (slavisha) on 2010-12-29T09:08:41Z No. of bitstreams: 1 30.pdf: 93832 bytes, checksum: c9a40befcad862e993fc226aed8ae349 (MD5)	en
dc.description.provenance	Made available in DSpace on 2010-12-29T09:08:41Z (GMT). No. of bitstreams: 1 30.pdf: 93832 bytes, checksum: c9a40befcad862e993fc226aed8ae349 (MD5) Previous issue date: 1997	en
dc.language.iso	en	en_US
dc.publisher	Obs. Astron. Belgrade	en_US
dc.title	MEASURED STARK WIDTH AND SHIFT OF 220.798 nm NEUTRAL SILICON SPECTRAL LINE	en_US
mf.document.pages	3	en_US
mf.contributor.editor-in-chief	Dimitrijević, S. Milan

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II Yugoslav Conference on Spectral Line Shapes

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